![](/img/cover-not-exists.png)
[IEEE 2019 International Symposium on Electronics and Smart Devices (ISESD) - Badung-Bali, Indonesia (2019.10.8-2019.10.9)] 2019 International Symposium on Electronics and Smart Devices (ISESD) - Study on Trapped Charge SONOS NVSM with Effect of Vg and Vds Programming state Variation
Rifqie, Dary Mochamad, Surawijaya, Akhmadi, Sulthoni, Muhammad Amin, Idris, IrmanYear:
2019
DOI:
10.1109/ISESD.2019.8909432
File:
PDF, 285 KB
2019