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[IEEE 2019 IEEE Energy Conversion Congress and Exposition (ECCE) - Baltimore, MD, USA (2019.9.29-2019.10.3)] 2019 IEEE Energy Conversion Congress and Exposition (ECCE) - MOSFET Junction Temperature Measurements using Conducted Electromagnetic Emissions and Support Vector Machines
Demus, Justin, Sysoeva, Viktoriia, Cheng, Qianyi, Boubin, Matt, Siraj, Ahmed, Scott, MarkYear:
2019
DOI:
10.1109/ECCE.2019.8912938
File:
PDF, 1.62 MB
2019