[IEEE 2019 IEEE International Conference on Electro Information Technology (EIT) - Brookings, SD, USA (2019.5.20-2019.5.22)] 2019 IEEE International Conference on Electro Information Technology (EIT) - ADISTES Ontology for Active Diagnosis of Sensors and Actuators in Distributed Embedded Systems
Saeed, Nazeer T Mohammed, Weber, Christian, Mallak, Ahlam, Fathi, Madjid, Obermaisser, Roman, Kuhnert, Klaus-DieterYear:
2019
DOI:
10.1109/eit.2019.8834013
File:
PDF, 337 KB
2019