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Effect of Oxide Thickness on The Two-State Characteristics in MIS(p) Tunnel Diode with Ultrathin Metal Surrounded Gate
Cheng, Chieh-Fang, Yang, Yung-Chun, Hwu, Jenn-GwoVolume:
8
Year:
2019
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.0191912jss
File:
PDF, 1.32 MB
2019