Improved statistical variability and delay performance with...

AEU - International Journal of Electronics and Communications 2020 / 02 Vol. 115

Improved statistical variability and delay performance with junctionless inserted oxide FinFET

Jegadheesan, V., Sivasankaran, K., Konar, Aniruddha
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Volume:
115
Journal:
AEU - International Journal of Electronics and Communications
DOI:
10.1016/j.aeue.2019.153030
Date:
February, 2020
File:
PDF, 1.64 MB
2020
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