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[IEEE 2019 IEEE XXVIII International Scientific Conference Electronics (ET) - Sozopol, Bulgaria (2019.9.12-2019.9.14)] 2019 IEEE XXVIII International Scientific Conference Electronics (ET) - The e-learning test system module for statistical analysis of tests’ results
Stoyanova, Lyudmila Yordanova, Minkovska, Daniela Veleva, Percuku, Arber ShefqetYear:
2019
DOI:
10.1109/et.2019.8878558
File:
PDF, 169 KB
2019