[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - DC and RF Characterization of InAs based Double Delta Doped MOSHEMT Device
Saravana Kumar, R, Poornachandran, R, Baskaran, S, Mohan Kumar, N, Sandhiya, S, Shanmugapriya, K.UYear:
2018
DOI:
10.1109/edkcon.2018.8770418
File:
PDF, 685 KB
2018