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Linearity Distortion Assessment and Small-Signal Behavior of Nano-Scaled SOI MOSFET for Terahertz Applications
Srivastava, Nilesh Anand, Mishra, Ram AwadhVolume:
8
Year:
2019
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.0201912jss
File:
PDF, 1.92 MB
2019