Analysis of electroluminescence spectra from high...

Optik 2019 / 11

Analysis of electroluminescence spectra from high optical-power density forward-biased silicon-led in standard CMOS technology

Cong, Jia, Mao, Luhong, Xie, Sheng, Guo, Weilian, Zhao, Fan, Cai, Haocheng
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Journal:
Optik
DOI:
10.1016/j.ijleo.2019.163793
Date:
November, 2019
File:
PDF, 1.04 MB
2019
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