Leakage Current Conduction Mechanism of Au-Pt-Ti/...

Leakage Current Conduction Mechanism of Au-Pt-Ti/ HfO2-Al2O3/n-InAlAs Metal-Oxide-Semiconductor Capacitor under Reverse-Biased Condition

Guan, He, Wang, Shaoxi
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Volume:
9
Journal:
Coatings
DOI:
10.3390/coatings9110720
Date:
November, 2019
File:
PDF, 2.40 MB
2019
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