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[IEEE 2019 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC) - New York, NY, USA (2019.8.1-2019.8.3)] 2019 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC) - Using Current Draw Analysis to Identify Suspicious Firmware Behavior in Solid State Drives
McDowell, Ryan, Rakvic, Ryan, Ngo, Hau, Walker, Owens, Ives, Robert, Brown, DaneYear:
2019
DOI:
10.1109/CSE/EUC.2019.00027
File:
PDF, 336 KB
2019