[IEEE 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Zaragoza, Spain (2019.9.10-2019.9.13)] 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Towards a KPI-based Ontology for Condition Monitoring of Automation Systems
Pasic, Faruk, Wohlers, Benedict, Becker, MatthiasYear:
2019
DOI:
10.1109/ETFA.2019.8869368
File:
PDF, 183 KB
2019