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[IEEE 2019 23rd International Conference on Mechatronics Technology (ICMT) - SALERNO, Italy (2019.10.23-2019.10.26)] 2019 23rd International Conference on Mechatronics Technology (ICMT) - Development of a Specimen Stage for Transmission Electron Microscopy
Choi, Kee-Bong, Lee, Jaejong, Kim, Geehong, Lim, Hyungjun, Kwon, Soongeun, Lee, Sang-ChulYear:
2019
DOI:
10.1109/ICMECT.2019.8932133
File:
PDF, 486 KB
2019