[IEEE 2019 IEEE Radiation Effects Data Workshop (IEEE) (in conjunction with NSREC 2019) - San Antonio, TX, USA (2019.7.8-2019.7.12)] 2019 IEEE Radiation Effects Data Workshop - A SET Study on SRAM Memory
Wang, Pierre Xiao, Glorieux, Maximilien, Polo, Cesar Boatella, Lochon, Frederic, Benedetto, Joseph M.Year:
2019
DOI:
10.1109/REDW.2019.8906532
File:
PDF, 262 KB
2019