Electrical Characterisation of Thick 3C-SiC Layers Grown on...

Materials Science Forum 2019 / 7 Vol. 963

Electrical Characterisation of Thick 3C-SiC Layers Grown on Off-Axis 4H-SiC Substrates

Li, Fan, Jokubavicius, Valdas, Jennings, Michael R., Yakimova, Rositza, Pérez Tomás, Amador, Russell, Stephen, Sharma, Yogesh, Roccaforte, Fabrizio, Mawby, Philip A., La Via, Francesco
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Volume:
963
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.963.353
Date:
July, 2019
File:
PDF, 2.14 MB
2019
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