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[IEEE 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Hangzhou, China (2019.10.21-2019.10.23)] 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Functional Safety Test Strategy for Automotive Microcontrollers During Electro-Magnetic Compatibility Characterization
Unger, Markus, Fries, Gunther, Steinecke, Thomas, Waghmare, Chetan, Ramaswamy, RameshYear:
2019
DOI:
10.1109/EMCCompo.2019.8919673
File:
PDF, 577 KB
2019