[IEEE 2019 IFIP/IEEE 27th International Conference on Very...

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[IEEE 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC) - Cuzco, Peru (2019.10.6-2019.10.9)] 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC) - A Simplified Layout-Level method for Single Event Transient Faults Susceptibility on Logic Gates

Schvittz, Rafael, Franco, Denis Teixeira, Soares, Leomar, Butzen, Paulo Francisco
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Year:
2019
DOI:
10.1109/VLSI-SoC.2019.8920333
File:
PDF, 214 KB
2019
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