Temperature Dependency of Silicon Carbide MOSFET...

Materials Science Forum 2019 / 7 Vol. 963

Temperature Dependency of Silicon Carbide MOSFET On-Resistance Characterization and Modeling

Dang, Dinh Lam, Urbain, Matthieu, Rael, Stephane
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Volume:
963
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.963.592
Date:
July, 2019
File:
PDF, 385 KB
2019
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