Imaging Atomically Thin Semiconductors Beneath Dielectrics...

Physical Review Applied 2019 / 12 Vol. 12; Iss. 6

Imaging Atomically Thin Semiconductors Beneath Dielectrics via Deep Ultraviolet Photoemission Electron Microscopy

Berg, Morgann, Liu, Fangze, Smith, Sean, Copeland, R. Guild, Chan, Calvin K., Mohite, Aditya D., Beechem, Thomas E., Ohta, Taisuke
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
12
Journal:
Physical Review Applied
DOI:
10.1103/PhysRevApplied.12.064064
Date:
December, 2019
File:
PDF, 1.94 MB
2019
Conversion to is in progress
Conversion to is failed