Multi-PVT-Point Analysis and Comparison of Recent...

Journal of Electronic Testing 2019 / 12

Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality Metrics

Al-Terkawi Hasib, Omar, Savaria, Yvon, Thibeault, Claude
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Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-019-05832-w
Date:
December, 2019
File:
PDF, 1.12 MB
2019
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