Quantitative EELS of nitrided gate oxides

Quantitative EELS of nitrided gate oxides

Stegmann, Heiko, Zschech, Ehrenfried
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Volume:
9
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927603013308
Date:
September, 2003
File:
PDF, 623 KB
2003
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