MIL-STD-781B Reliability Tests: Exponential Distribution

MIL-STD-781B Reliability Tests: Exponential Distribution

Neathammer, Robert D., Pabst, William R., Wigginton, Carl G.
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Volume:
1
Journal:
Journal of Quality Technology
DOI:
10.1080/00224065.1969.11980346
Date:
January, 1969
File:
PDF, 1.72 MB
1969
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