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[IEEE 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - Kita-Kyushu City, Fukuoka, Japan (2019.3.18-2019.3.21)] 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - Optimization of 3ω Method for Phase-Change Materials Thermal Conductivity Measurement at High Temperature
Serra, Anna Lisa, Bourgeois, Guillaume, Cyrille, Marie Claire, Cluzel, Jacques, Garrione, Julien, Navarro, Gabrie, Nowak, EtienneYear:
2019
DOI:
10.1109/icmts.2019.8730993
File:
PDF, 1.18 MB
2019