Narrow-beam X-ray tests of CCD edge response
Stephen Kuhlmann, Harold Spinka, Joseph P. Bernstein, Kevin A. Beyer, Lisa M. Gades, Thomas E. Kasprzyk, Antonino Miceli, Richard A. Spence, Richard TalagaVolume:
29
Language:
english
Pages:
10
DOI:
10.1007/s10686-010-9204-3
Date:
April, 2011
File:
PDF, 457 KB
english, 2011