High resolution multielement XRF spectroscopy of extended and diffused sources with a graphite mosaic crystal based Von Hamos spectrometer
Scordo, A., Breschi, L., Curceanu, C., Miliucci, M., Sirghi, F., Zmeskal, J.Volume:
35
Year:
2020
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/c9ja00269c
File:
PDF, 2.39 MB
2020