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Combined Focused Ion Beam-Ultramicrotomy Method for TEM Specimen Preparation of Porous Fine-Grained Materials
Ohtaki, Kenta K., Ishii, Hope A., Bradley, John P.Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927619015186
Date:
December, 2019
File:
PDF, 485 KB
2019