A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap
Szypryt, P., O’Neil, G. C., Takacs, E., Tan, J. N., Buechele, S. W., Naing, A. S., Bennett, D. A., Doriese, W. B., Durkin, M., Fowler, J. W., Gard, J. D., Hilton, G. C., Morgan, K. M., Reintsema, C. DVolume:
90
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5116717
Date:
December, 2019
File:
PDF, 5.41 MB
2019