Confidence Limits for the Number of Defectives in a Lot

Confidence Limits for the Number of Defectives in a Lot

Tomsky, J. L., Nakano, K., Iwashika, M.
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Volume:
11
Journal:
Journal of Quality Technology
DOI:
10.1080/00224065.1979.11980912
Date:
October, 1979
File:
PDF, 775 KB
1979
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