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[IEEE 2019 3rd International Conference on Circuits, System and Simulation (ICCSS) - Nanjing, China (2019.6.13-2019.6.15)] 2019 3rd International Conference on Circuits, System and Simulation (ICCSS) - Heavy ion-and Proton-induced SEU Simulation and Error Rates Calculation in 0.15um SRAM-based FPGA
Sun, Yi, Zhang, Hong-Wei, Wei, Zhi-Chao, Yu, Qing-Kui, Tang, Min, Shen, Chen, Gong, DingYear:
2019
DOI:
10.1109/CIRSYSSIM.2019.8935625
File:
PDF, 3.44 MB
2019