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[IEEE 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Hangzhou, China (2019.10.21-2019.10.23)] 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Immunity Model of the Embedded CAN Controller to Conducted Interferences
Dongyao, Zhang, Changlin, Zhou, Daojie, Yu, Shuang, Li, Kai, He, zhilong, ZhangYear:
2019
DOI:
10.1109/EMCCompo.2019.8919788
File:
PDF, 159 KB
2019