Characterization of nanostructured HfO2films using...

Characterization of nanostructured HfO2films using Perturbed Angular Correlation (PAC) technique

F. H. M. Cavalcante, M. R. Gomes, A. W. Carbonari, L. F. D. Pereira, D. A. Rossetto, M. S. Costa, L. M. Redondo, J. Mestnik-Filho, R. N. Saxena, J. C. Soares
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Volume:
198
Language:
english
Pages:
5
DOI:
10.1007/s10751-010-0250-z
Date:
June, 2010
File:
PDF, 564 KB
english, 2010
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