[IEEE 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) - Paris, France (2019.9.1-2019.9.6)] 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) - Terahertz Non-Destructive Thickness Characterization of Optically Thin Scale Layers on Steel
Zhai, Min, Locquet, Alexandre, Roquelet, Cyrielle, Citrin, D.S.Year:
2019
DOI:
10.1109/irmmw-thz.2019.8874181
File:
PDF, 100 KB
2019