[IEEE 2019 20th IEEE International Conference on Mobile...

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[IEEE 2019 20th IEEE International Conference on Mobile Data Management (MDM) - Hong Kong, Hong Kong (2019.6.10-2019.6.13)] 2019 20th IEEE International Conference on Mobile Data Management (MDM) - MISCELA: Discovering Correlated Attribute Patterns in Time Series Sensor Data

Harada, Kei, Sasaki, Yuya, Onizuka, Makoto
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Year:
2019
DOI:
10.1109/mdm.2019.00-72
File:
PDF, 2.63 MB
2019
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