Matched X-Ray Reflectometry and Diffractometry of...

Semiconductors 2019 / 12 Vol. 53; Iss. 14

Matched X-Ray Reflectometry and Diffractometry of Super-Multiperiod Heterostructures Grown by Molecular Beam Epitaxy

Goray, L. I., Pirogov, E. V., Sobolev, M. S., Ilkiv, I. V., Dashkov, A. S., Vainer, Yu. A., Svechnikov, M. V., Yunin, P. A., Chkhalo, N. I., Bouravlev, A. D.
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Volume:
53
Journal:
Semiconductors
DOI:
10.1134/S1063782619140082
Date:
December, 2019
File:
PDF, 453 KB
2019
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