Total Reflection X-Ray Fluorescence Spectroscopy: Analysis Of Gaas And InGaAs
Filcs-Sesler, Leigh Ann, Plumton, Don, Kao, Yung-Chung, Kim, Tae S.Volume:
37
Year:
1993
Journal:
Advances in X-ray Analysis
DOI:
10.1154/S037603080001613X
File:
PDF, 388 KB
1993