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Molecular cytogenetic characterization of wheat–Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust
Gong, Biran, Zhu, Wei, Li, Sanyue, Wang, Yuqi, Xu, Lili, Wang, Yi, Zeng, Jian, Fan, Xing, Sha, Lina, Zhang, Haiqin, Qi, Pengfei, Huang, Lin, Chen, Guoyue, Zhou, Yonghong, Kang, HouyangVolume:
19
Journal:
BMC Plant Biology
DOI:
10.1186/s12870-019-2208-x
Date:
December, 2019
File:
PDF, 2.40 MB
2019