Characterization of the performance and failure mechanisms of boron-doped ultrananocrystalline diamond electrodes
Brian P. Chaplin, Ian Wyle, Hongjun Zeng, John A. Carlisle, James FarrellVolume:
41
Language:
english
Pages:
12
DOI:
10.1007/s10800-011-0351-7
Date:
November, 2011
File:
PDF, 3.00 MB
english, 2011