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Measurement of the thickness of thin polymer layers by infrared frustrated total internal reflection spectroscopy
N. A. Nikonenko, O. N. TretinnikovVolume:
75
Language:
english
Pages:
5
DOI:
10.1007/s10812-009-9119-9
Date:
November, 2008
File:
PDF, 128 KB
english, 2008