IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences
2017 Vol. E100.A; Iss. 12
Identification and Application of Invariant Critical Paths under NBTI Degradation
BIAN, Song, MORITA, Shumpei, SHINTANI, Michihiro, AWANO, Hiromitsu, HIROMOTO, Masayuki, SATO, TakashiVolume:
E100.A
Year:
2017
Journal:
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
DOI:
10.1587/transfun.E100.A.2797
File:
PDF, 1.28 MB
2017