A Physically-Based Analytic Model for Stress-Induced Hole...

Journal of Computational Electronics 2004 / 10 Vol. 3; Iss. 3-4

A Physically-Based Analytic Model for Stress-Induced Hole Mobility Enhancement

Borna Obradovic, Philippe Matagne, Lucian Shifren, Everett Wang, Mark Stettler, Jun He, Martin D. Giles
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Volume:
3
Language:
english
Pages:
4
DOI:
10.1007/s10825-004-7037-x
Date:
October, 2004
File:
PDF, 223 KB
english, 2004
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