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A Computational Model of NBTI and Hot Carrier Injection Time-Exponents for MOSFET Reliability
Haldun Kufluoglu, Muhammad Ashraful AlamVolume:
3
Language:
english
Pages:
5
DOI:
10.1007/s10825-004-7038-9
Date:
October, 2004
File:
PDF, 686 KB
english, 2004