Intrinsic Parameter Fluctuations in Conventional MOSFETs at the Scaling Limit: A Statistical Study
Fikru Adamu-Lema, Gareth Roy, Andrew R. Brown, Asen Asenov, Scott RoyVolume:
3
Language:
english
Pages:
4
DOI:
10.1007/s10825-004-7045-x
Date:
October, 2004
File:
PDF, 276 KB
english, 2004