Physical modeling of hole mobility in silicon inversion layers under uniaxial stress
Ji Zhao, Yaohua Tan, Jianping Zou, Zhiping YuVolume:
6
Language:
english
Pages:
3
DOI:
10.1007/s10825-006-0075-9
Date:
September, 2007
File:
PDF, 297 KB
english, 2007