Sensitivity of single- and double-gate MOS architectures to...

Journal of Computational Electronics 2006 / 07 Vol. 5; Iss. 2-3

Sensitivity of single- and double-gate MOS architectures to residual discrete dopant distribution in the channel

P. Dollfus, A. Bournel, J. E. Velázquez
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Volume:
5
Language:
english
Pages:
5
DOI:
10.1007/s10825-006-8830-5
Date:
July, 2006
File:
PDF, 345 KB
english, 2006
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