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Study of performance and leakage currents in nanometer-scale bulk, SOI and double-gate MOSFETs
Sudarshan Narayanan, C. Sachs, M. V. FischettiVolume:
7
Language:
english
Pages:
4
DOI:
10.1007/s10825-008-0228-0
Date:
March, 2008
File:
PDF, 351 KB
english, 2008