Random variability modeling and its impact on scaled CMOS circuits
Yun Ye, Samatha Gummalla, Chi-Chao Wang, Chaitali Chakrabarti, Yu CaoVolume:
9
Language:
english
Pages:
6
DOI:
10.1007/s10825-010-0336-5
Date:
December, 2010
File:
PDF, 451 KB
english, 2010