Measurement of Microwave Dielectric Properties of...

Journal of Electroceramics 2004 / 07-11 Vol. 13; Iss. 1-3

Measurement of Microwave Dielectric Properties of Pb(Zr1−xTrx)O3Thin Films

Seung Eon Moon, Eun-Kyoung Kim, Su-Jae Lee, Min-Hwan Kwak, Young-Tae Kim, Han-Cheol Ryu, Won-Jeong Kim, Tae-Kwun Song
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Volume:
13
Language:
english
Pages:
4
DOI:
10.1007/s10832-004-5108-9
Date:
July, 2004
File:
PDF, 162 KB
english, 2004
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