Characterization of Crystalline Carbon Nitride Films...

Characterization of Crystalline Carbon Nitride Films Deposited on Si and Si3N4/Si Substrate by RF Magnetron Sputtering System with DC Bias

J. G. Lee, S. P. Lee
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Volume:
13
Language:
english
Pages:
6
DOI:
10.1007/s10832-004-5120-0
Date:
July, 2004
File:
PDF, 329 KB
english, 2004
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