Mechanism of capacitance aging under DC-bias field in X7R-MLCCs
Takaaki Tsurumi, Motohiro Shono, Hirofumi Kakemoto, Satoshi Wada, Kenji Saito, Hirokazu ChazonoVolume:
21
Language:
english
Pages:
5
DOI:
10.1007/s10832-007-9071-0
Date:
December, 2008
File:
PDF, 218 KB
english, 2008