Characterization of Au/Pb(Zr0.96Ti0.04)O3/Al2O3/Si antiferroelectric field-effect transistors for memory application
Xu-Dong Weng, Qing-Qing Sun, An-Quan Jiang, David-Wei ZhangVolume:
25
Language:
english
Pages:
5
DOI:
10.1007/s10832-010-9612-9
Date:
October, 2010
File:
PDF, 202 KB
english, 2010